Euro-me collaborates with NEXENS®¶αOR to participate in th ↓™e 2025 Laser of photoσ™"nics  China 2025
 

2025 marks the 30th an♦≥₹ niversary of the establishmα£↕ent of Euo-me Company.As the gener&∑₩<al agent of NEXENSOR and MSG inσ∞ ≈ the China region, Euro←£-me will participate together with≈₹"  the two companies in the L→♥aser World of Photonics Chi βna 2025 held at the Shanghai Nπφew International Expo Center f®≠>λrom March 11-13, 2025.
As the annual event of≥✔₽σ the Asian laser, opticaΩ↔φ l, and optoelectronic industries, the L≤₹Ωaser World of Photonics China Expo wil↓$βl be held from March  α€λ11-13, 2025 at the N1-N5 and E7-E γ4 halls of the entrance hall 3 of ★​π‍the Shanghai New Interna™÷tional Expo Center. In 202ασ5, the 20th anniversary of the Munic♦≥h Shanghai Light Expo wil←§ l be celebrated. The theme o∞↓β≠f this exhibition is "Never S←×top Working, Start a N•β ew Journey with Intelligence". γ‌≤Over 1400 exhibitors will gather in S<‍₩hanghai, with a display area of over π§100000 square meters. It is expected th™∑∞≠at there will be 200 confer→≠ence reports during the same peri£γ→←od.

Our booth number is E7-7372.

At this exhibition, we will s♠↔π$howcase the latest testing techn>Ω​ology applied by South K¥↓♣←orean company Naishen in the semico☆→ Ωnductor and display indust​→φ≈ry
1. High speed line scanning ' ↔"white light triangulatio✔πn sensor for detecting BGA and BUMP.
2. Provide a comprehens∞&£ive 3D optical measurement solut<₽ion for the advanced s→₩< emiconductor packaging industry.
3. White light interferometric s∞↕λ✘canning sensor - measuremen∏•→t speed only takes 1 second, Z-diγ‍✘rection repeatability a×λ$$ccuracy of 10nm, can be integra‌σ©ted into equipment for batch d"↔ etection.
4. Interference based t→€™hickness/displacement s"®ensor - using near-infrared &↑interferometry, a single proφ♣×be can measure thickness/dis×∑$placement, suitable fo₹♣λΩr applications such as wafer thicknes≈₽ s measurement.
We look forward to many∑"φ new and old customers  ✘₩→and friends visiting our booth, p±↕←roviding guidance, and exploring↑♥ cooperation!

Exhibiting products:
3D Optical Measurement Overallγ ≠ Solution  &nb★αsp;     >≈ ;    &n∏₩βbsp; 3D Scanning Interferomβ$βeter Microscope